![](https://news.europawire.eu/wp-content/uploads/2018/08/ZEISS-presented-its-cloud-based-digital-microscopy-platform-at-the-Microscopy-Microanalysis-conference-in-Baltimore-USA-144x144.jpeg)
Experience the cloud-based platform at M&M in Baltimore, booth 624 JENA/Germany, BALTIMORE/USA, 14-Aug-2018 — /EuropaWire/ — ZEISS presents the initial release of its cloud-based digital microscopy platform, known under the name APEER at the Microscopy & Microanalysis conference (M&M) in Baltimore, … Read the full press release