Tag Archives: ZEISS MultiSEM 505

Microscopy Today magazine selected ZEISS MultiSEM 505 as a recipient of the 2015 Microscopy Today Innovation Award

JENA, 4-8-2015 — /EuropaWire/ — ZEISS MultiSEM 505 has been selected by a team of judges from Microscopy Today magazine as a recipient of the 2015 Microscopy Today Innovation Award. The world’s fastest scanning electron microscope (SEM) is regarded as … Read the full press release