Tag Archives: ZEISS Xradia 810 Ultra X-ray microscope

ZEISS introduced new Xradia 810 Ultra X-ray microscope and speeds nanoscale X-ray imaging up to 10 times

Posted on 13, August 2013 by EuropaWire PR Editors

New ZEISS Xradia 810 Ultra X-ray microscope extends the reach and value of 3D imaging for science and industry JENA/Germany, PLEASANTON/California/USA , 13-8-2013 — /EuropaWire/ — ZEISS is introducing a new X-ray microscopy (XRM) solution that increases throughput for three-dimensional imaging at … Read the full press release →

Posted in Business, Electronics & Machinery, Germany, Science, Technology

Tagged 2013 Microscopy and Microanalysis conference, California, Carl Zeiss X-ray Microscopy, Dr. Jochen Tham, Dr. Kevin Fahey, Inc., Jena, nano scale resolution, nanoscale, nanoscale X-ray imaging speed, PLEASANTON, three-dimensional imaging, X-ray microscope, ZEISS, ZEISS Xradia 810 Ultra X-ray microscope, Zernike phase contrast