Tag Archives: 2013 Microscopy and Microanalysis conference

ZEISS introduced new Xradia 810 Ultra X-ray microscope and speeds nanoscale X-ray imaging up to 10 times

New ZEISS Xradia 810 Ultra X-ray microscope extends the reach and value of 3D imaging for science and industry   JENA/Germany, PLEASANTON/California/USA , 13-8-2013 — /EuropaWire/ — ZEISS is introducing a new X-ray microscopy (XRM) solution that increases throughput for three-dimensional imaging at … Read the full press release