New ZEISS Xradia 810 Ultra X-ray microscope extends the reach and value of 3D imaging for science and industry JENA/Germany, PLEASANTON/California/USA , 13-8-2013 — /EuropaWire/ — ZEISS is introducing a new X-ray microscopy (XRM) solution that increases throughput for three-dimensional imaging at … Read the full press release
Posted in Business, Electronics & Machinery, Germany, Science, Technology
Tagged 2013 Microscopy and Microanalysis conference, California, Carl Zeiss X-ray Microscopy, Dr. Jochen Tham, Dr. Kevin Fahey, Inc., Jena, nano scale resolution, nanoscale, nanoscale X-ray imaging speed, PLEASANTON, three-dimensional imaging, X-ray microscope, ZEISS, ZEISS Xradia 810 Ultra X-ray microscope, Zernike phase contrast
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