Tag Archives: IEDM2018

IEDM2018: STMicroelectronics presents architecture and performance benchmarks of technology based on 28nm FD-SOI with embedded ePCM designed for its automotive microcontrollers

Innovative embedded Phase-Change Memory (ePCM) for automotive MCUs sampling now Initial performance benchmarks presented at IEDM 2018 Will support faster and more complex computing needs in automotive systems GENEVA, 11-Dec-2018 — /EuropaWire/ — STMicroelectronics (NYSE: STM), a global semiconductor leader serving customers across … Read the full press release