(IN BRIEF) A team of scientists, led by Dr. Matthew Davey of SAMS, has discovered an expansive ecosystem on the Robert Island ice cap in Antarctica, dominated by photosynthetic algae. This ecosystem, which covers up to 20% of the mapped … Read the full press release
Posted in Education, Environment, News, Science, Technology, United Kingdom
Tagged Antarctic Peninsula, Antarctica, British Antarctic Survey, CCAP, climate models, DNA analysis, Dr. Alex Thomson, Dr. Andrew Gray, Dr. Matthew Davey, ecosystem, endemic, glacial melt, glacier algae, ice cap, Instituto Antártico Chileno, microscopy, Naomi Thomas, Nature Communications, new species, Norwegian Institute for Nature Research, photosynthetic algae, Robert Island, RRS Sir David Attenborough, SAMS, snow algae, UHI, UKRI NERC, University of Cambridge, University of Edinburgh
(PRESS RELEASE) OBERKOCHEN, 25-Jan-2021 — /EuropaWire/ — ZEISS announces the launch of a new innovative digital microscope ZEISS Visioner 1. Thanks to its Micro-mirror Array Lens System (MALS™), ZEISS Visioner 1, for the first time enables all-in-one focus in real time. … Read the full press release
(PRESS RELEASE) OBERKOCHEN, 31-Aug-2020 — /EuropaWire/ — ZEISS, the German optical systems and optoelectronics manufacturer, has announced the introduction of a new Advanced Reconstruction Toolbox, essentially a powerful workstation in combination with ZEISS OptiRecon and ZEISS DeepRecon, to its industry-leading … Read the full press release
Posted in Germany, News, Science, Technology
Tagged 3D image reconstruction, 3D X-ray imaging, 3D X-ray microscopes, Advanced Reconstruction Toolbox, algorithms, Context microCT systems, DeepRecon, Dongshin University, Dr. Stefan Preuss, FDK, Feldkamp-Davis-Kress, microCT, microscopy, OptiRecon, polymer separator, Professor. Dr. J.H. Shim, reconstruction technology, semiconductor, Semiconductor Manufacturing Technology, South Korea, Xradia Context 3D X-ray micro-computed tomography, Xradia Versa, XRM, ZEISS, ZEISS DeepRecon, ZEISS OptiRecon, ZEISS Xradia Versa
Experience the cloud-based platform at M&M in Baltimore, booth 624 JENA/Germany, BALTIMORE/USA, 14-Aug-2018 — /EuropaWire/ — ZEISS presents the initial release of its cloud-based digital microscopy platform, known under the name APEER at the Microscopy & Microanalysis conference (M&M) in Baltimore, … Read the full press release
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