Tag Archives: Matthias Gohl

ZEISS presented its cloud-based digital microscopy platform at the Microscopy & Microanalysis conference in Baltimore, USA

Posted on 14, August 2018 by

Experience the cloud-based platform at M&M in Baltimore, booth 624 JENA/Germany, BALTIMORE/USA, 14-Aug-2018 — /EuropaWire/ — ZEISS presents the initial release of its cloud-based digital microscopy platform, known under the name APEER at the Microscopy & Microanalysis conference (M&M) in Baltimore, … Read the full press release →

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