Tag Archives: scanning electron microscope

ZEISS presents new generation of its proven high performance scanning electron microscope ZEISS EVO

Modular platform for intuitive operation, routine investigations and research applications JENA, Germany, 06-Nov-2017 — /EuropaWire/ — ZEISS presents the new generation of its proven high performance scanning electron microscope (SEM): The new instruments of the ZEISS EVO family come with a … Read the full press release